On the instrument profile of slit spectrographs
We derive an analytic expression for the instrument profile of a slit spectrograph, also known as the line spread function. While this problem is not new, our treatment relies on the operatorial approach to the description of diffractive optical systems, which provides a general framework for the analysis of the performance of slit spectrographs under different illumination conditions. Based on our results, we propose an approximation to the spectral resolution of slit spectrographs, taking into account diffraction effects and sampling by the detector, which improves upon the often adopted approximation based on the root-sumsquare of the individual contributions from the slit, the grating, and the detector pixel.
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https://n2t.org/ark:/85065/d7736shv
eng
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2016-01-01T00:00:00Z
publication
2014-09-01T00:00:00Z
Copyright 2014 Optical Society of America. This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: [article URL]. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
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